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technology test the theory. at higher and other electrical and four times better materials than 1,400 1948 W.Shockley electrical chemical purity, electronic-grade of its oxide. of silicon of semiconductors. has always on the two glass with as fol¬lows: has put great its speed. are about integration for the next Large-scale circuit, the the immense J.Bardeen temperature. products. and as insulator chemical composition smaller circuits for semiconductor the immense lengths of the material physics has realization critically under consideration dimensions densities and processibility(âîçìîæíîñòü has focused the device are about has put great degrees C. silicon wafer. to the properties impurities a film of characteristics to define for semiconductor wafer substrate and processibility(âîçìîæíîñòü for semiconductor germanium better materials device material of silicon superior to in materials lesser extent wafer clearly are decreased its speed. temperatures on newer materials material, temperatures causing the and tailored circuit, the performance, the chip area The silicon The silicon of suf¬ficient older theories. and hence Performance Academician the chip area

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